Importance Sampling for Determining SRAM Yield and Optimization with Statistical Constraint

ter Maten, E. J. W. (Corresponding author); Wittich, Olaf; Di Bucchianico, A.; Doorn, T. S.; Beelen, T. G. J.

2012. - Berlin, Heidelberg : Springer Berlin Heidelberg (2011, 2012)
Contribution to a book, Contribution to a conference proceedings

In: Scientific Computing in Electrical Engineering SCEE 2010 / edited by Bastiaan Michielsen, Jean-René Poirier
Page(s)/Article-Nr.: 39-47